Increasing Redundancy Exponentially Reduces Error Rates during Algorithmic Self-Assembly

Posted in Journal Articles on September 29, 2015 at 12:01 pm by JCCMP

Increasing Redundancy Exponentially Reduces Error Rates during Algorithmic Self-Assembly.
Authors:Rebecca Schulman, Christina Wright, and Erik Winfree.
ACS Nano 9,5760(2015)

Recommended with a commentary by Randall D.Kamien, University of Pennsylvania.
|View Commentary|

JCCM_September_2015_02

Guidelines for Comments by Members:
Members are invited to comment on the chosen papers and refer only to papers intimately related to the papers selected. Other comments and suggestions can be transmitted to the organizers through the 'Guest book' link. These comments will be put on the web-site and the archives so that they can be read by other members. Just as in the Guidelines to the Corresponding Members, we suggest that the comments be confined to substantive issues of science and in order to illuminate the subject matter. A collegial and respectful tone is suggested. Issues of priority should not be raised in the comments.

Leave Your Comment Below

Your email address will not be published. Required fields are marked *

google

google