Observation of Electron-Hole Puddles in Graphene Using a Scanning Single Electron Transistor

Posted in Journal Articles on July 25, 2007 at 8:19 am by JCCMP

Authors: J. Martin, N. Akerman, G. Ulbricht, T. Lohmann, J. H. Smet, K. von Klitzing, and A. Yacoby
http://arxiv.org/abs/0705.2180

Recommended with a Commentary by Francisco Guinea, Instituto de Ciencia de Materiales de Madrid | View Commentary (pdf) |

JCCM_July07_02

One response on “Observation of Electron-Hole Puddles in Graphene Using a Scanning Single Electron Transistor”

  1. Yonko Millev says:

    This manuscript has already been published
    in Physical Review Letters:

    Phys. Rev. Lett. 99, 015301 (2007)

    (cf prl.aps.org)

    Regards,
    Yonko Millev

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